使用高光谱成像对多孔建筑石的水分含量估计
Danish Ali Chaghdo1,2, Bikram Koirala3, Laura Cristina4
1Monuments and Monumental Decoration Lab, Royal Institute of Cultural Heritage (KIK-IRPA), JubelPark 1, Brussels, 1000, Belgium. danish.ali.chaghdo@kikirpa.be.
这项研究表明,短波红外 (SWIR) 超光谱成像可以准确地测量石头的水分含量. 该技术有助于评估与水分相关的恶化风险,以保护建筑遗产.
科学领域:
- 建筑材料科学 建筑材料科学
- 保护科学 保护科学
- 地质物理学 地质物理学
背景情况:
- 湿度是建筑遗产恶化的主要驱动因素,通过结,盐结晶和生物生长造成损害.
- 准确评估石头的水分含量对于有效的遗产保护战略至关重要.
研究的目的:
- 为了验证使用短波红外 (SWIR) 超光谱成像来非破坏性地确定石头的水分含量.
- 创建和验证水分地图,说明水分分布在各种类型的石头.
主要方法:
- 从六种类型 (Brick,Euville,Massangis,Neubrunn,Obernkirchen,Savonnières) 准备石头样本 (立方体和圆柱形),并控制湿度.
- 采集SWIR超光谱图像并使用规范相对弧度长度 (NRAL) 方法进行处理,以生成湿度图.
- 通过岩石学检查和量化比较与重力测量湿度含量验证湿度地图.
主要成果:
- 通过SWIR成像和重力测量测量估计的水分含量之间发现了强烈的一致性.
- 湿度含量估计的根平均平方误差在1到2g/g×100之间.
- 湿度地图准确地描绘了水的分布,与石头孔隙特征和粒度排列相关联.
结论:
- SWIR高光谱成像是一种可靠的非破坏性技术,用于评估建筑遗产中的石材水分含量.
- 这种方法提供了有价值的数据,以了解与水分有关的恶化,并为保护工作提供信息.
- 该NRAL方法有效地生成各种石材的湿度分布图.
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