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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
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Mass Spectrum: Interpretation01:24

Mass Spectrum: Interpretation

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An unknown compound can be established by identifying the molecular ion peak in the mass spectrum. The molecular ion peak is often weak or absent due to the predominance of fragmentation in high-energy electron beams. In such cases, a soft-energy electron beam can be used to scan the spectrum to enhance the intensity of the molecular ion peak. Additionally, chemical ionization, field ionization, and desorption ionization spectra are used to obtain a relatively intense molecular ion peak.To...
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Mass Analyzers: Overview01:13

Mass Analyzers: Overview

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The mass analyzer is a crucial component of the mass spectrometer. In the ionization chamber, the vaporized sample is bombarded with a high-energy electron beam to generate a radical cation and further fragment into neutral molecules, radicals, and cations. A series of negatively charged accelerator plates accelerate the cations into the mass analyzer. The mass analyzer separates ions according to their mass-to-charge (m/z) ratios and then directs them to the detector. The common types of mass...
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相关实验视频

Updated: Jan 8, 2026

Controlled Synthesis and Fluorescence Tracking of Highly Uniform PolyN-isopropylacrylamide Microgels
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Controlled Synthesis and Fluorescence Tracking of Highly Uniform PolyN-isopropylacrylamide Microgels

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验证电子对分布函数分析:多重散射,光束,测量和处理参数的作用.

Sangjun Kang1, Hyeyoung Cho2, Maximilian Töllner2

  • 1In situ Electron Microscopy, Department of Materials Science, Technical University of Darmstadt (TUDa), 64287 Darmstadt, Germany; Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany; Karlsruhe Nano Micro Facility (KNMFi), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany.

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概括

这项研究通过使用模拟和实验调查关键参数,优化了对无序材料的电子对分布函数 (ePDF) 分析. 它为无形和纳米结构材料的精确结构分析提供了指导方针.

关键词:
电子对的分布函数是电子对的分布函数.四维扫描传输电子显微镜四维扫描传输电子显微镜辐射分布函数的辐射分布函数这是一个STEM-PDF.

更多相关视频

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2
11:27

Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2

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相关实验视频

Last Updated: Jan 8, 2026

Controlled Synthesis and Fluorescence Tracking of Highly Uniform PolyN-isopropylacrylamide Microgels
11:34

Controlled Synthesis and Fluorescence Tracking of Highly Uniform PolyN-isopropylacrylamide Microgels

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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2
11:27

Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2

Published on: December 8, 2016

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科学领域:

  • 材料科学 材料科学 材料科学
  • 凝聚物质物理学 凝聚物质物理学
  • 电子显微镜电子显微镜

背景情况:

  • 电子对分布函数 (ePDF) 分析与4D-STEM相结合,提供了对无序材料中局部原子结构的详细见解.
  • 准确的ePDF分析对实验和仪器参数都很敏感,因此需要进行系统的调查以获得可靠的结果.

研究的目的:

  • 系统地调查各种电子光学,测量和处理参数对ePDF分析准确性的影响.
  • 确定从无序的材料中提取精确的ePDF数据的最佳条件.
  • 为提高ePDF分析的精度和可靠性提供实际指导方针.

主要方法:

  • 使用多切片电子衍射模拟作为参数调查的主要工具.
  • 通过使用4D-STEM数据进行实验验证的模拟.
  • 检查了衍射角度范围,光束收,探测器分辨率,样品厚度,噪声和光束前行的影响.

主要成果:

  • 确定了影响ePDF准确性的关键参数,包括衍射角度范围,光束收度和样品厚度.
  • 量化了噪音和探测器分辨率对ePDF提取的影响.
  • 证明了电子束偏移对减少文物和提高数据质量的影响.

结论:

  • 在无序的材料中建立了准确 ePDF 分析的最佳条件.
  • 为研究人员提供实用指南,以提高ePDF研究的精度和可靠性.
  • 为 ePDF 分析无形和纳米结构材料技术的进步做出了贡献.