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Updated: May 13, 2026

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography
08:11

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

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揭示完整的金属电池接口的循环诱导演变,使用冷凝聚焦离子束截面和电子显微镜

Kevin C Matthews1, Rinish R Vaidyula2, Charles B Mullins1,2,3

  • 1Materials Science and Engineering Program and Texas Materials Institute, The University of Texas at Austin, 204 East Dean Keeton Street, Austin, TX, 78712, USA.

Small (Weinheim an der Bergstrasse, Germany)
|December 15, 2025
PubMed
概括

一种全新的全细胞低温聚焦离子束 (cryo-FIB) 研磨技术揭示了电池接口如何降解. 不同的溶剂导致不同的降解途径,影响离子电池的性能和寿命.

关键词:
电池 电池 电池 电池 电池化-FIB 的情况.电子显微镜的电子显微镜材料的表征材料的表征

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相关概念视频

Cryo-electron Microscopy01:28

Cryo-electron Microscopy

Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...