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Updated: Jan 8, 2026

Atomically Traceable Nanostructure Fabrication
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纳米技术打开了纳米艺术的新宇宙

Jinsai Tian1, Jiayi Chen1, Yue Liu1

  • 1State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, China.

National science review
|December 17, 2025
PubMed
概括

纳米技术通过融合科学和艺术表达,使纳米艺术的新形式成为可能. 创新方法是推动这种创意交叉的关键.

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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