对背景寄生物的阻抗测量进行校正,以在冷环境中对电路组件进行表征
R J Carpenter1, J Anczarski2,3, I Rydstrom1
1Department of Physics and Engineering Physics, Santa Clara University, Santa Clara, California 95053, USA.
The Review of scientific instruments
|December 17, 2025
概括
使用LCR计和背景校正的新实验方法准确地测量了被动电路元件的温度依赖阻抗. 这种技术可以扩大LCR仪表的精度,用于电子测量,直到米基尔文温度.
科学领域:
- 电气工程 电气工程
- 材料科学 材料科学 材料科学
- 低温物理 低温物理
背景情况:
- 精确的电子测量需要可预测的电路响应.
- 在低温温度下测量被动电路元件阻抗存在挑战.
- 在测量设置中的寄生阻抗可以显著影响精度.
研究的目的:
- 开发一种简单的实验方法来测量被动电路元件的温度依赖阻抗.
- 实施一个现场寄生阻抗背景校正程序.
- 扩大商业LCR仪表在低温温度下的精度.
主要方法:
- 使用了价格实惠的LCR仪表,并使用了寄生阻抗背景校正程序.
- 采用简单的双线测量技术,在单次冷静机运行中进行测量.
- 多层陶电容器,薄膜电容器和厚膜电阻器的测量阻抗 (大小和相位) 从300K到360mK.
主要成果:
- 观察到22μF多层陶电容冷却到360mK的电容度下降了~20倍.
- 测量了100 MΩ厚膜电阻在冷却时电阻的数量级增加.
- 证明该方法有效地测量了组件寄生性,并扩大了LCR仪表的精度.
结论:
- 开发的方法和分析模型为温度依赖阻抗测量提供了强大而简单的方法.
- 该技术成功地描述了各种被动组件的冷行为.
- 该方法仅限于其当前配置中的电容精度约为10 pF.
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