在低温下使用MoS2纳米薄膜的充电运输模式:对低温电子产品的影响
Michael D Thompson1, Matthew Haworth1, Owain T Hughes1
1Department of Physics, Lancaster University, Lancaster LA1 4YB, U.K.
概括
调查MoS2晶体管揭示了两个电荷传输机制:Efros-Shklovskii在高门电压下跳跃,在低门电压下热激活. 这影响了量子电子学的二维材料FET.
科学领域:
- 材料科学 材料科学 材料科学
- 凝聚物质物理学 凝聚物质物理学
- 纳米技术纳米技术
背景情况:
- 二硫化物 (MoS2) 场效应晶体管 (FET) 对电子应用具有前景.
- 在低温温度下了解MoS2 FET中的电荷传输机制对于量子电子学至关重要.
研究的目的:
- 通过广泛的温度范围 (0.3271 K) 调查n型后门MoS2 FET中的电子传输机制.
- 分析温度对电气特性和值电压变化的影响.
主要方法:
- 从低凯尔文到室温的MoS2 FET的电特性.
- 在低排水电压下,分析在下值区域的排水电流变化.
- 应用可变范围跳跃理论和热激活模型.
主要成果:
- 确定了两种不同的电荷传输机制:高门电压时的 Efros-Shklovskii 跳跃和低门电压时的热激活.
- 一个显著的温度依赖的门电压变化 (大约. 110mV/K) 观察到,覆盖范围高达30V.
- 在FETs内部存在并行导电通道的证据表明存在电阻网络.
结论:
- 这些发现突显了在低温温度下控制MoS2 FETs的复杂物理.
- 这些电荷传输特征必须考虑在量子电子中开发二维材料FET.
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