通过光发光光增亮吸收损伤部位的非破坏性识别
Optics express
|December 19, 2025
概括
我们开发了一种非破坏性的光发光成像方法,用于追踪化中激光诱导的损伤. 高强度激光脉冲会导致光发光变亮 (PLB),信号缺陷生成和预测未来的损害增长.
科学领域:
- 材料科学 材料科学 材料科学
- 光学工程是指光学工程.
- 激光物理 激光物理
背景情况:
- 激光对光学材料 (如化) 造成的损伤是一个关键问题.
- 了解缺陷动态是预测和减轻损坏的关键.
- 在现场监测需要非破坏性表征方法.
研究的目的:
- 引入一种新的非破坏性光发光 (PL) 成像策略.
- 为了研究激光照射下缺陷生成和消灭的动态.
- 为了将光发光的行为与激光诱导的损伤增长相关联.
主要方法:
- 短暂的广场光发光 (PL) 成像.
- 不同的激发强度 (在532 nm时高达>0.3 GW/cm2).
- 对PL火和亮化 (PLB) 事件的分析.
主要成果:
- 低激发强度导致PL灭 (缺陷消灭).
- 高激发强度 (>0.3 GW/cm2) 诱导了显著的PLB (辐射缺陷生成).
- PLB事件与随后的损伤增长有很强的相关性 (10J/cm2在351nm).
结论:
- 光发光亮度 (PLB) 是辐射缺陷生成的敏感指标.
- 通过PLB监测,可以识别具有高吸收性的损伤部位.
- 这种技术可以实现有针对性的维护,以改善光学材料中的激光损伤管理.
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