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在微型X射线光光谱学中补偿厚度效应,使用集成光学显微镜来确定软物质块共聚合物膜的厚度

Riccarda Müller¹, Leon Weckenmann¹, Nigar Aslanova²

¹Institute of Analytical and Bioanalytical Chemistry (IABC), Ulm University, Albert-Einstein-Allee 11, 89081, Ulm, Germany.

Analytical and bioanalytical chemistry

|December 19, 2025

概括

一种新的非侵入性光学方法使用2D μXRF精确测量软物质样品厚度 (25-1000μm). 该技术通过直接量化和比较样本而无需改变样本结构,从而简化了元素分析.

科学领域:

材料科学材料科学材料科学
分析化学分析化学
频谱学是一种光谱学.

背景情况:

精确的厚度测定对于分析软物质样本至关重要.
传统方法可能具有侵入性或改变样本结构.
2D微型X射线光光谱 (2D μXRF) 是一个强大的元素分析工具.

研究的目的:

开发和验证一种用于测量软物质样品物理厚度的非侵入性方法.
将厚度测定与2DμXRF分析相结合,以进行增强的元素量化.
为了能够在不同厚度的样本中可靠地比较和纠正元素强度.

主要方法:

使用了基于实验室的2DμXRF仪器的集成光学显微镜.
开发了一种适用于厚度从25到1000微米的软矩阵的非侵入性技术.
通过将物理厚度测量与样本结构完整性进行比较来验证该方法.

主要成果:

成功开发并验证了一种用于软物质厚度测定的非侵入性光学方法.
证明该方法测量物理,而不是光学,厚度没有样本改变.
展示了在同一样本上进行厚度测量之前或之后进行元素分析的能力.

结论:

开发的方法提供了一种简单的,非侵入性的方法来测量软物质的厚度,这对于准确的元素分析至关重要.
使用这种方法进行厚度正常化可以弥补质量-厚度效应,允许可靠的样本比较.
未来的工作可以利用这种技术在软物质中使用2D μXRF和外部校准进行直接元素定量.

关键词:

块共聚合物膜的区块共聚合物基本的绘制元素映射.功能性软物质材料用于光催化.厚度补偿是一种补偿.厚度的确定厚度的确定二维微型X射线光光谱学二维微型X射线光谱学

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