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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
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Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

2.8K
Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
2.8K
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

6.8K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
6.8K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

12.9K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
12.9K
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

1.1K
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
1.1K
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

612
Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
612

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相关实验视频

Updated: Jan 8, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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使用单立体直接电子探测器进行能量分解的EBSD.

Nicolò M Della Ventura1, Kalani Moore2, McLean P Echlin1

  • 1Materials Department, University of California Santa Barbara, Santa Barbara, CA, USA.

Ultramicroscopy
|December 19, 2025
PubMed
概括
此摘要是机器生成的。

这项研究量化了电子反射散射 (EBSD) 模式中的反射散射电子 (BSE) 能量. 我们的新方法揭示了BSE能量如何影响图案清晰度和晶体测量.

关键词:
直接的电子检测检测直接的电子检测电子反射散射器的折射差异是电子的反射差异.电子计数计数电子的计数.过能源过器的使用方法能量的测量能源测量

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

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相关实验视频

Last Updated: Jan 8, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

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科学领域:

  • 材料科学 材料科学 材料科学
  • 固态物理 固态物理
  • 电子显微镜电子显微镜

背景情况:

  • 精确量化电子反射散射 (EBSD) 模式中的反射散射电子 (BSE) 能量分布是一个持续的挑战.
  • 了解BSE能量对于解释衍射对比度和提高测量精度至关重要.

研究的目的:

  • 引入和验证一个能量解析的EBSD方法,用于在衍射模式中量化单个BSE能量.
  • 调查BSE能量对EBSD模式质量和晶体信息的影响.

主要方法:

  • 采用了一种单体活跃像素传感器直接电子探测器和电子计数算法,用于能量分辨率EBSD.
  • 校准了探测器响应与主要光束能量,并用12 keV光束对Si{100}进行测量.
  • 采用蒙特卡洛模拟进行比较,并分析像素分辨率的能量图.

主要成果:

  • 观察到一个广泛的BSE能量分布 (低至3keV) 与角度依赖,匹配模拟.
  • 鉴定了基库奇频段边缘的调制,并使用能量过证明了显著的模式增强.
  • 发现9-10 keV范围内的BSE是基库奇模式形成的关键,但较低能量的BSE (2-8 keV) 也有所贡献.

结论:

  • 开发的能量解决的EBSD方法使单电子能量的确定成为可能,扩大了定量EBSD能力.
  • 这种技术为深入了解衍射对比机制和改进晶体学测量提供了潜力.