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Xuanxuan Yang1, Yangming Zhang2, Haofeng Chen3
1Hefei Institutes of Physical Science, Chinese Academy of Sciences, 350 Shushanhu Road, Hefei, Anhui, 230031, China; Department of Precision Instruments and Precision Machinery, University of Science and Technology of China, 96 Jinzhai Road, Hefei, 230026, Anhui, China.
我们介绍了电阻断层扫描 (EIT) 的新框架,该框架使用双学习来改进导电成像. 这种方法提高了重建的稳定性和效率,使用稀疏,杂的边界数据.
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