对以事件驱动的3FI ASIC进行评估,用于用同步子辐射进行光谱X射线检测
Piotr Maj1, Grzegorz W Deptuch1, Dominik S Gorni1
1Instrumentation Department, Brookhaven National Laboratory, PO Box 5000, Upton, NY 11973-5000, USA.
Journal of synchrotron radiation
|December 22, 2025
概括
一个新的特定应用集成电路 (ASIC) 能够实现高速,全场光光谱X射线成像. 这种新型探测器设计为各种研究中的微量元素微分析提供了出色的能量分辨率.
科学领域:
- 仪器仪表和测量仪器的使用
- 材料科学 材料科学 材料科学
- 频谱学是一种光谱学.
背景情况:
- 传统的X射线光显微镜通常需要机械扫描,限制数据采集速度和吞吐量.
- 开发先进的探测器对于复杂样品的高分辨率实时元素分析至关重要.
研究的目的:
- 介绍一款用于全场光光谱X射线成像 (3FI) 的新型应用特定集成电路 (ASIC) 的设计和评估.
- 评估原型探测器系统在现场微分析微量元素的性能.
主要方法:
- 使用65nmCMOS工艺制造一个32x32像素的ASIC,与传感器结合.
- 实现每像素电路,包括放大器,过器和峰值检测器,用于事件驱动的读数.
- 在同步光线 (NSLS-II) 上评估能量分辨率和功耗.
主要成果:
- 在低功耗 (200微瓦/像素) 的情况下实现了每通道光谱性能.
- 测量的能量分辨率为308 eV FWHM在8.04 keV和138 eV FWHM在3.69 keV.
- 展示了无,以事件驱动的读取,用于高速数据采集.
结论:
- 3FI ASIC原型提供出色的能量分辨率和低功耗,适合微量元素微分析.
- 无架构克服了基于扫描的方法的局限性,实现了连续的,高通量全场成像.
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