您也可能阅读
通过共同作者、期刊和引用图与本文相关的文章。
Updated: Jan 7, 2026
Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution
Published on: August 16, 2012
Tomer Slor, Dean Oren, Shira Baneth+2
深度学习模型现在可以使用光学数据来诊断镜头系统错位. 这种自动化方法提高了多元镜头系统的精确成像制造和质量控制.
A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
Published on: May 30, 2016
Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform
Published on: February 12, 2014
科学领域:
背景情况:
研究的目的:
主要方法:
主要成果:
结论: