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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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X-ray Crystallography02:18

X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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Overview of Electron Microscopy01:25

Overview of Electron Microscopy

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
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Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
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相关实验视频

Updated: Jan 7, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

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增强电子反射散射的角分辨率,提高电子反射散射的衍射模式.

T Ben Britton1, Tianbi Zhang1

  • 1Department of Materials Engineering, University of British Columbia, Vancouver, British Columbia, Canada.

Ultramicroscopy
|December 25, 2025
PubMed
概括
此摘要是机器生成的。

这项研究引入了一种新的"转移和添加"技术,以改善电子反射散射衍射 (EBSD) 模式的角度分辨率. 这种方法增强了EBSD模式中的角信息,有利于直接电子探测器 (DED).

关键词:
衍射的差异化方式电子显微镜的电子显微镜图像处理 图像处理

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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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科学领域:

  • 材料科学 材料科学 材料科学
  • 晶体学 晶体学是指结晶学.
  • 电子显微镜电子显微镜

背景情况:

  • 电子反射衍射 (EBSD) 对于微观结构和晶体分析至关重要.
  • 提高EBSD模式的角度分辨率可以提高数据质量和分析能力.
  • 直接电子探测器 (DED) 在速度和灵敏度方面具有优势,但可以从改进的模式信息中受益.

研究的目的:

  • 介绍一个简单的"移动和添加"方法来增强EBSD模式的角分辨率.
  • 证明增强模式包含的角度信息比传统单个模式更多.
  • 探索该技术在提高紧型DED的性能方面的潜力.

主要方法:

  • 实现一个"移动和添加"算法用于EBSD模式处理.
  • 使用子像素图像注册以根据投影参数差异对齐图案.
  • 使用 2D 快速里埃转换 (FFT) 分析模式信息.

主要成果:

  • "移动和添加"方法成功地提高了EBSD模式的角分辨率.
  • 与长期暴露单个模式相比,增强的EBSD模式包含了明显更多的角度信息.
  • 2D FFT分析证实了处理模式中的信息含量增加.

结论:

  • "移动和添加"技术提供了一种简单有效的方法来提高EBSD角分辨率.
  • 这一进步对使用紧型DED的应用具有重大潜力,扩大了其分析范围.
  • 该方法为从EBSD获得更高质量的晶体学数据提供了有价值的工具.