4H-SiC MOSFET:4H-SiC MOSFET:-

Mamta Dhyani1, Smriti Singh1, Nir Tzhayek1

  • 1Department of Electrical and Electronic Engineering, Ariel University, Ariel 40700, Israel.

Micromachines
|December 31, 2025
PubMed
概括

碳化 (SiC) MOSFET中的偏差温度不稳定性 (BTI) 与模型有所不同. 一个新的现场驱动框架改善了SiC功率转换器的可靠性预测.

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