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Updated: Jan 7, 2026

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
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Published on: May 15, 2017

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研究了一种改进的YOLOv8检测方法,用于光学元件表面缺陷的研究

Bei Ma1, Jialong Zhao1, Shun Zhou1

  • 1School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710021, China.

Micromachines
|December 31, 2025
PubMed
概括

这项研究介绍了BACG-YOLOv8,这是一种用于检测光学元件表面缺陷的增强物体识别算法. 改进的模型在识别关键缺陷方面实现了更高的准确性和效率,这对高级应用至关重要.

关键词:
注意力机制注意力机制深度学习是一种深度学习.的光学元件的组成部分.表面缺陷 表面缺陷

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