Jove
Visualize
联系我们
JoVE
x logofacebook logolinkedin logoyoutube logo
关于 JoVE
概览领导团队博客JoVE 帮助中心
作者
出版流程编辑委员会范围与政策同行评审常见问题投稿
图书馆员
用户评价订阅访问资源图书馆顾问委员会常见问题
研究
JoVE JournalMethods CollectionsJoVE Encyclopedia of Experiments存档
教育
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab Manual教师资源中心教师网站
使用条款与条件
隐私政策
政策

相关概念视频

Maximum Deflection01:13

Maximum Deflection

948
When analyzing beams under unsymmetrical loads, such as a train moving on a bridge, it is crucial to accurately determine the points of maximum stress and deflection. The process involves identifying the maximum deflection of the beam, which may not always occur at its midpoint due to the uneven distribution of the load.
The maximum deflection occurs at a specific point, known as point O, where the tangent to the deflection curve is horizontal. To find point O, the slope of the tangent at any...
948
Difference from Background: Limit of Detection01:05

Difference from Background: Limit of Detection

8.0K
The limit of detection (LOD) is the smallest amount of analyte that can be distinguished from the background noise. The LOD value corresponds to the concentration at which the analyte signal is three times larger than the standard deviation of the blank signal. Below this value, the analyte signal cannot be differentiated from the background noise. It is calculated by dividing the calibration slope by 3 times the standard deviation of the blank signals.
The LOD indicates the presence or absence...
8.0K

您也可能阅读

相关文章

通过共同作者、期刊和引用图与本文相关的文章。

排序
Same author

High encoding-sensitivity vision sensor with complementary nonlinear neuromorphic computing.

Nature communications·2026
Same author

4E-BP1 acts as a molecular rheostat balancing regenerative healing and fibrotic scarring.

Experimental & molecular medicine·2026
Same author

Population Genetic Differentiation and Runs of Homozygosity Analysis of <i>Bursaphelenchus xylophilus</i> in Southwest China.

Genes·2026
Same author

Artificial plateau neurons with in-situ spike-malleability for rhythmic quadrupedal locomotion.

Nature communications·2026
Same author

Author Correction: Ultra-coherent meta-emitter tailors arbitrary thermal wavefront.

Nature communications·2026
Same author

CMOS-Integrated Synaptic Photoreceptor Chip Inspired by Insect Visual Processing.

Advanced science (Weinheim, Baden-Wurttemberg, Germany)·2026
Same journal

Active devices and systems for closed-loop neuromodulation.

Microsystems & nanoengineering·2026
Same journal

An automated, digital immunoassay on a microfluidic cartridge for on-demand cytokine profiling.

Microsystems & nanoengineering·2026
Same journal

An integrated framework TSV-INet for arbitrarily distributed TSV interposer wafer warpage simulation.

Microsystems & nanoengineering·2026
Same journal

Mechanistic insights into cellular deformation enable enhanced extensional-flow cytometry for label-free classification and sorting.

Microsystems & nanoengineering·2026
Same journal

AlGaN/GaN HEMT H₂ sensor with integrated Wheatstone bridge and on-chip microheater for 0.1-ppm detection.

Microsystems & nanoengineering·2026
Same journal

Fully flexible large-area MEMS-based triaxial force sensor compatible with flat panel display manufacturing.

Microsystems & nanoengineering·2026
查看所有相关文章

相关实验视频

Updated: Jan 7, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

8.2K

基于侧向偏移的优化实现了子皮科米特检测极限.

Qihai Jiang1, Baoshi Qiao1,2, Xiaolei Ding1

  • 1ZJU-UIUC Institute, International Campus, Zhejiang University, Haining, 314400, China.

Microsystems & nanoengineering
|December 31, 2025
PubMed
概括
此摘要是机器生成的。

研究人员开发了一种新方法,用于使用倾斜原子力显微镜 (AFM) 探针进行高度敏感的纳米尺度移位测量. 这种技术可以达到低于皮科米的精度,提高了材料和设备的特征.

更多相关视频

Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies
09:45

Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies

Published on: June 12, 2018

10.0K
Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
05:04

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

2.3K

相关实验视频

Last Updated: Jan 7, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

8.2K
Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies
09:45

Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies

Published on: June 12, 2018

10.0K
Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
05:04

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

2.3K

科学领域:

  • 纳米技术 纳米技术
  • 材料科学 材料科学 材料科学
  • 物理 物理学 物理

背景情况:

  • 在扫描朱尔膨胀显微镜 (SJEM) 等先进技术中,子皮克米准确度位移测量至关重要.
  • 目前的方法往往依赖于专门而昂贵的原子力显微镜 (AFM) 探针,限制了可访问性和增加了复杂性.

研究的目的:

  • 提出和演示一个通用,高效的战略,在纳米尺度上高灵敏度的位移检测.
  • 在SJEM等技术中增强位移分辨率.

主要方法:

  • 利用倾斜的AFM探针的扭矩反应来放大变形信号.
  • 实施可适应各种基于AFM的表征技术的通用策略.

主要成果:

  • 实现了0.37比克米 (分钟) 的移位分辨率创纪录.
  • 提高了近一个数量级的测量灵敏度.
  • 证明灵活调节灵敏度和在平面内和平面外位移的解.

结论:

  • 建立了一个可转移的,基于AFM的战略,用于高灵敏度的位移检测.
  • 为材料和设备的纳米尺度表征和分析提供了宝贵的指导.
  • 为专门的AFM探测器提供了一个更容易获得和更不复杂的替代方案.