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Updated: Jan 7, 2026

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在现场扫描传输电子显微镜/传输电子显微镜研究CuO纳米线基记忆器中的缺陷驱动的Ag离子动力学和导线演变

Ching-Heng Hung1, Chong-Chi Chi2, Kai-Yuan Hsiao1

  • 1Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 300, Taiwan.

ACS applied materials & interfaces
|January 5, 2026
PubMed
概括

No abstract available in PubMed .

关键词:
CuO纳米线导电机制电化学金属化工艺在现场的TEM离子迁移电阻切换

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