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范德瓦尔斯材料的3D光学属性的表征,使用基于深度学习的连贯里埃散射法
Anubhav Paul1, Kumar Rishav1, Guus Klootwijk1
1Imaging Physics Department, Faculty of Applied Sciences, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands.
我们开发了一种使用连贯里埃散射计和深度学习的新方法,快速测量薄膜的光学特性. 这种技术准确地描述了范德瓦尔斯材料中的内平面和外平面异构性.
科学领域:
- 材料科学 材料科学 材料科学
- 光学是什么?光学是什么?光学是什么?
- 纳米技术纳米技术
背景情况:
- 在范德瓦尔斯 (vdW) 材料中描述光学异构性对于基础科学和纳米光子学至关重要.
- 现有的方法,如光谱圆测量,对平面外测量有局限性,需要大,均的薄膜.
研究的目的:
- 提出一种新的框架,用于快速,无标签地对异构薄膜中的内平面和外平面折射率进行表征.
- 克服用于VDW材料的传统技术的局限性.
主要方法:
- 连贯里埃散射计 (CFS) 与深度学习模型 (AnisoVision) 相结合.
- 在模拟的角度光谱上使用4x4 Berreman矩阵形式主义来训练AnisoVision.
- 利用辐射偏光和三个远场亚齐图斯横截面,以有效捕获异性异性.
主要成果:
- 精确检索不同厚度的同otropic 和 anisotropic 材料 (h-BN, α-MoO3) 的折射率.
- 在多个样本中证明模型稳定性和一致性.
- 验证了该技术对局部地区的单一射击,非破坏性.
结论:
- 与深度学习相结合的CFS为低维材料的高通量光学计量提供了一个强大的平台.
- 该技术适用于异质或脱皮样品,可以扩展到宽带光谱.
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