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相关概念视频

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray...
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Here, we present a protocol on how to determine the quantity and distribution of metals in a sample using synchrotron X-ray fluorescence. We focus on adherent cells, and describe the chemical fixation method to prepare this sample. We then describe how to mount and image the sample using synchrotron X-rays.
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Source: Derek Wilson, Asantha Cooray, PhD, Department of Physics & Astronomy, School of Physical Sciences, University of California, Irvine, CA
Light travels at different speeds depending on the material through which it is propagating. When light travels from one material to another, it will either slow down or speed up. In order to conserve energy and momentum, the light must change the direction in which it propagates. This bending of light is known as refraction. Some fraction of...
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相关实验视频

Updated: Jan 20, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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从微米尺度的表面使用纳米光束的X射线反射率.

Vedran Vonk1, Steffen Tober2, Steven J Leake3

  • 1Centre for X-ray and Nano Science CXNS Deutsches Elektronen-Synchrotron DESY Notkestraße 85 22607 Hamburg Germany.

Journal of applied crystallography
|January 19, 2026
PubMed
概括

精确的对齐是纳米级牧场发作X射线测量的关键. 这项研究引入了一种1D轨迹扫描方法,以保持样本在X射线束中的位置,提高反射率数据的准确性.

关键词:
在X射线纳米光束中.在X射线反射的反射性.

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相关实验视频

Last Updated: Jan 20, 2026

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科学领域:

  • 材料科学 材料科学 材料科学
  • 表面科学是一门学科.
  • 纳米技术纳米技术

背景情况:

  • 精确的样本对齐对于纳米级牧场发生率X射线测量至关重要.
  • 由于系统错误和样本移动,保持一致的光束-样本相互作用是具有挑战性的.

研究的目的:

  • 开发和演示一种方法,在反射度测量过程中,在X射线束内的表面上保持一个特定的感兴趣点.
  • 为了应对在纳米尺度对齐样本X射线分析的挑战.

主要方法:

  • 采用1D轨迹扫描技术,改变发生角度 (θ),探测器角度 (2θ) 和沿一个轴的样本位置.
  • 在10×10μm金 (Au) 岛上使用90nm光束进行了X射线反射度测量.

主要成果:

  • 一维轨迹扫描成功地保持了样品在X射线束内的位置.
  • 数据分析考虑了取决于角度的X射线束足迹在样品和周围支上.

结论:

  • 开发的1D轨迹扫描方法提高了纳米级X射线反射度测量的可靠性.
  • 这种技术对于精确的表面分析是有价值的,当精确的样品定位是困难的.