用于双层X射线成像的厚层的表征.
Akyl Swaby1, Kaitlin Hellier1, Linxi Shi2
1Department of Electrical and Computer Engineering, University of California Santa Cruz, Santa Cruz, CA 95064, USA.
概括
厚厚的无形 (a-Se) 层被制造为双层X射线平面探测器 (DL-FPD). 更厚的a-Se层增强了X射线吸收和光电流,但可能会增加信号持久性.
科学领域:
- 医学物理 医学物理
- 材料科学 材料科学 材料科学
- 射线成像技术X射线成像技术
背景情况:
- 无形 (a-Se) 是一种直接转换的X射线光导体,具有用于X射线成像的优良特性.
- 厚厚的a-Se层正在探索具有成本效益的双层X射线平板探测器 (DL-FPD).
研究的目的:
- 为DL-FPDs制造和评估厚厚的无形层.
- 调查a-Se层厚度对探测器性能的影响,包括暗电流,光响应和时间滞后.
主要方法:
- 制造的253微米和414微米a-Se样本与聚胺孔堵塞接触.
- 在电场高达10 V/μm时,测量到低于10 pA/mm2的暗电流抑制.
- 在低能X射线照射下评估光响应和分析时间延迟.
主要成果:
- 两个制造的a-Se层都表现出低暗电流.
- 414微米的a-Se层显示出更高的光电流,这是由于光子吸收增加.
- 较厚的a-Se样本在较低偏差下显示出更多的信号持久性,这表明载体捕获增加.
结论:
- 厚厚的a-Se层对DL-FPD是可行的,提供了更好的光子吸收.
- 层厚度会影响载体捕获和信号持久性,需要仔细考虑读出电子设计.
- 这些发现为优化未来的直接/间接DL-FPD设计提供了关键指标.
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