:X线

Yuxing Fei1,2, Matthew J McDermott2, Christopher L Rom3

  • 1Department of Materials Science & Engineering, University of California, Berkeley, California 94720, United States.

Chemistry of materials : a publication of the American Chemical Society
|February 16, 2026
PubMed
概括

多相材料的粉末X射线衍射 (XRD) 分析由Dara自动化,这是一个新的框架. 这种数据驱动的方法提高了相位识别的准确性和可靠性,减少了手工工作.