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Updated: Feb 19, 2026

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
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Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

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推进纳米石墨学:使用AFM进行局部阳极氧化材料的全面审查

Matteo Lorenzoni1

  • 1Materials Characterization Facility, Istituto Italiano di Tecnologia, via Morego 30, 16163 Genoa, Italy.

Beilstein journal of nanotechnology
|February 18, 2026
PubMed
概括

局部阳极氧化 (LAO) 使用原子力显微镜进行纳米尺度的图案设计. 本综述详细介绍了LAO在纳米技术进步中使用的半导体,金属和2D材料等材料.

关键词:
当地的阳极氧化.纳米制造的纳米制造扫描探头 石版 扫描探头

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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