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相关概念视频

X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
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X-ray Crystallography02:18

X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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X-ray Imaging01:24

X-ray Imaging

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German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with...
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X-ray crystal spectrometer throughput, data treatment, and configuration over the JET DTE2 and DTE3 campaigns.

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相关实验视频

Updated: Feb 20, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

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两个轴的度仪设施用于X射线对光器的特征.

A M Patel1

  • 1United Kingdom Atomic Energy Authority, Culham Campus, Abingdon, Oxfordshire OX14 3DB, United Kingdom.

The Review of scientific instruments
|February 18, 2026
PubMed
概括

本研究详细介绍了一种双轴光度计和X射线源,用于测量JET光谱仪中的晶体反射率. 该系统实现了高精度,所有布拉格角度的电机偏差约为2弧秒.

科学领域:

  • 物理 物理学 物理
  • 材料科学 材料科学 材料科学

背景情况:

  • 精确测量晶体反射率对于光谱仪的性能至关重要.
  • 现有的方法可能缺乏精度或适用于先进应用的多功能性.

研究的目的:

  • 描述一种用于X射线衍射测量的新型两轴光度计系统.
  • 评估系统的精度和适用于JET光谱仪的适用性.

主要方法:

  • 使用一个双轴的度仪与一个X射线源相结合.
  • 测量双晶集成反射率和计算单晶值.
  • 分析了同步的衍射器运动概况和角误差.

主要成果:

  • 仪系统表现出高精度,角误差约为2弧秒.
  • 在布拉格角度 (0°-86°) 的全范围中观察到有利的角误差分布.
  • 极化调整使得单晶集成反射率的准确估计成为可能.

结论:

  • 描述的光度计系统适用于频谱仪应用中的精确反射度测量.
  • 该系统的精度和广角范围使其对材料分析和仪器校准具有价值.

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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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