在共聚焦拉曼显微镜中,用石墨烯横边扫描量化确定侧面空间分辨率
Zhong-Jie Wang1,2, Tao Liu1,2, Xue-Lu Liu1,2
1State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.
The Review of scientific instruments
|February 18, 2026
概括
这项研究提出了一种新的方法来测量侧向空间分辨率 (LSR) 在使用石墨烯的共聚焦拉曼显微镜. 最佳的LSR取决于精确的激光聚焦和针孔大小,这对于纳米级成像至关重要.
科学领域:
- 材料科学 材料科学 材料科学
- 频谱学是一种光谱学.
- 显微镜的使用方法
背景情况:
- 侧向空间分辨率 (LSR) 对共聚焦拉曼显微镜至关重要,它决定了分辨纳米级化学和结构细节的能力.
- 准确的LSR测定对于可靠的微和纳米分析至关重要.
研究的目的:
- 引入一种定量方法来确定共聚焦拉曼显微镜的LSR.
- 评估实验参数对LSR的影响.
主要方法:
- 在石墨烯边缘上利用横边一维拉曼扫描测量.
- 分析了面积敏感的G模式和边长敏感的D模式强度配置文件.
- 测试了具有不同数值孔径 (NA = 0.25-0.90) 和针孔大小的目标.
主要成果:
- 测量到的LSR值接近射有限的估计值,高NA目标 (0.90) 的近零针孔大小.
- 较大的对焦孔径导致LSR值超过了衍射有限的预测.
- LSR性能对激光聚焦,针孔大小和相对于目标入口瞳孔的光束膨胀敏感.
结论:
- 开发的方法提供了一种实用方法,用于在共聚焦拉曼显微镜中进行定量LSR评估.
- 精确控制激光聚焦,针孔孔径和光束直径对于实现最佳分辨率至关重要.
- 这些发现适用于各种实验条件和显微镜设置.
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