对模拟集成电路的强大和高效的优化设计方法的研究
Yunqi Yang1,2, Jiayuan Fang1,2, Huachen Dong1,2
1Faculty of Integrated Circuit, Xidian University, Xi'an 710071, China.
Micromachines
|February 27, 2026
概括
本综述探讨了模拟集成电路 (IC) 面临现代CMOS挑战的高效和强大的设计方法. 它强调拓合成,参数优化和转移学习,以提高性能和可靠性.
科学领域:
- 电气工程 电气工程
- 计算机工程 计算机工程
- 材料科学 材料科学 材料科学
背景情况:
- 对于模拟集成电路 (IC) 设计来说,CMOS技术的发展带来了重大挑战.
- 传统的手动和模拟重型设计方法对于复杂的高性能系统是不够的.
- 对性能,稳定性和快速设计周期的越来越严格的要求需要先进的方法.
研究的目的:
- 系统地审查模拟IC的高效和强大的优化设计方法.
- 为了比较和讨论各种设计方法的优点和局限性.
- 提供对模拟IC设计未来发展趋势的见解.
主要方法:
- 研究了包括拓合成,参数优化和转移学习在内的代表性高效设计方法.
- 检查了强大的优化设计方法,包括工艺,电压和温度 (PVT) 的变化.
- 考虑了寄生效应和环境影响对电路可靠性的影响.
主要成果:
- 像拓合成和转移学习这样的高效方法可以提高设计速度和性能.
- 强大的方法对于解决先进节点中的PVT变异和寄生效应至关重要.
- 对比分析揭示了设计效率,性能和可靠性之间的权衡.
结论:
- 对于现代模拟IC开发来说,先进,高效和强大的设计方法是必不可少的.
- 未来的研究应该专注于整合这些方法,以满足不断变化的技术需求.
- 本综述是对模拟IC设计的研究人员和工程师的参考.
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