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Updated: Mar 8, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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基于EDF-YOLOv10的印刷电路板的缺陷检测方法

Zhijuan Shen1, Yonger Yao1, Lin Liu1

  • 1School of Mechanical, Electronic & Information Engineering, Putian University, Putian, Fujian, China.

PloS one
|March 6, 2026
PubMed
概括

本研究介绍了一种增强的YOLOv10算法 (EDF-YOLOv10) 用于印刷电路板 (PCB) 缺陷检测,提高了小物体识别和融合速度. 还开发了一个实时检测系统,实现了显著的性能提升.

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