在42 ≤ Z ≤ 83个元素中,使用反射几何和低能量的Au L X射线,研究L的光发射
S P Manoj1, K Sripathi Punchithaya1, Ismayil1
1Manipal Institute of Technology, Manipal Academy of Higher Education, Manipal, Karnataka, 576104, India.
概括
这项研究测量了元素42≤Z≤83.3的LX射线光度. 这些发现改善了定量X射线光 (XRF) 分析和L-shell光生产的理论模型.
科学领域:
- 原子物理 原子物理
- 材料科学 材料科学 材料科学
- 分析化学 分析化学
背景情况:
- L-shell X射线光 (XRF) 对于元素分析至关重要.
- 对于定量XRF,需要准确的理论模型.
- 了解电子转换是精确分析的关键.
研究的目的:
- 为了研究L-shell X射线光对原子数 (Z) 介于42和83之间的元素.
- 为了估计光横截面和产量.
- 将实验结果与理论预测和文献数据进行比较.
主要方法:
- 使用PIN (Si-PIN) 探测器进行LX射线光分析.
- 测量是在低能量的黄金 (Au) L-X射线发射率的反射几何中进行的.
- 发射的X射线相对于Lα的强度比率被计算和理论估计.
主要成果:
- 对于研究的元素,估计了光交叉切口和产量.
- 计算强度比,并与理论和实验数据进行比较.
- 观察到的偏差凸显了在测量能量范围内电子转换的复杂性.
结论:
- 该研究为定量XRF分析提供了有价值的数据.
- 这些发现有助于完善L-shell光生成的理论模型.
- 结果强调需要进一步研究复杂的电子过渡.
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