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Updated: Mar 12, 2026

Preparing an Isotopically Pure 229Th Ion Beam for Studies of 229mTh
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Preparing an Isotopically Pure 229Th Ion Beam for Studies of 229mTh

Published on: May 3, 2019

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为高分辨率电荷检测质谱仪使用放射细分离子镜的优化.

David W Reitenbach1, Martin F Jarrold1

  • 1Chemistry Department, Indiana University, 800 E Kirkwood Ave, Bloomington, Indiana 47405, United States.

Journal of the American Society for Mass Spectrometry
|March 10, 2026
PubMed
概括

电荷检测质谱 (CD-MS) 使用静电线性离子陷 (ELIT) 来进行质量测量. 细分ELIT电极允许修剪潜力纠正错位,改善异质样本的质量分辨率.

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