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Updated: Mar 14, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
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Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

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一个光子计数微型计算机断层扫描实验室设置的特征

My Celander1, Robin Krüger1, Niccolò Peruzzi1

  • 1Department of Medical Radiation Physics, Clinical Sciences Lund, Lund University, Barngatan 4, 22185 Lund, Sweden.

Radiation protection dosimetry
|March 13, 2026
PubMed
概括

这项研究描述了内部微型计算机断层扫描 (CT) X射线设置. 该系统实现了12微米的空间分辨率,这对于微型CT成像研究来说是一个有价值的指标.

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