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Updated: Mar 15, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

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截断顺序选择的统计方法用于评估冷原子重力计中的波面偏移效应

Jingsheng Tan, Zhe Xie, Yuanzheng Liu

    Optics letters
    |March 13, 2026
    PubMed
    概括

    这项研究引入了一种使用Leave-One-Out交叉验证和F统计的新方法,以准确评估冷原子重力计 (CAG) 中的波面偏差 (WAE). 这种方法改善了Zernike多项式切割顺序的确定,提高了测量精度.

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