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Updated: Mar 15, 2026

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
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Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Published on: May 15, 2017

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通过模板选择和不相似性映射来解决缺陷意图模糊性,以免训练的确定性PCB缺陷定位.

Saiyan Saiyod1, Woottichai Nonsakhoo1, Zhengping Li1

  • 1Hardware-Human Interface and Communications Laboratory (H2I-Comm Lab), Department of Computer Science, College of Computing, Khon Kaen University, Khon Kaen 40002, Thailand.

Sensors (Basel, Switzerland)
|March 14, 2026
PubMed
概括

本研究引入了一种新的,无需培训的框架,用于印刷电路板 (PCB) 的自动光学检查 (AOI). 该方法有效地使用参考模板检测缺陷,实现高精度和回忆可靠的通过/失败决策.

关键词:
自动化的光学检查 (AOI)相关性 相关性 相关性发现缺陷检测检测缺陷检测缺陷定位 缺陷定位区别地图 差异地图 地图图像处理是图像处理的过程.印刷电路板 (PCB) 是一种印刷电路板.这是一个定量值.结构上的相似性.模板选择选择模板的选择

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