通过探测器尼奎斯特采样精确的透镜扭曲测量
Yongqiang Yang1,2, Zhiyi Wang1, Junlin Li1
1Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China.
Sensors (Basel, Switzerland)
|March 14, 2026
概括
这项研究引入了一种新的透镜扭曲测试方法,使用尼奎斯特采样. 它可以非常精确地为工业成像镜头实现高精度的扭曲测量.
科学领域:
- 光学工程是指光学工程.
- 图像计量学 图像计量学
- 镜头的特征 镜头的特征
背景情况:
- 镜头扭曲显著影响成像性能.
- 精确的扭曲测量对于工业应用至关重要.
- 现有的方法可能缺乏精度或分辨率.
研究的目的:
- 开发一个高精度的镜头扭曲测试方法.
- 为了能够准确地测量扭曲分布.
- 为了评估传统的工业成像镜头.
主要方法:
- 使用探测器尼奎斯特采样图像数据.
- 在Nyquist采样条件下分析Moiré边缘图案.
- 应用相位移算法和扭曲公式.
主要成果:
- 实现了高测试准确度和采样分辨率.
- 在图像平面扭曲方面表现出一致的线性趋势.
- 获得的放大偏差因子可重复度为±108 nm/cm.
- 实现了 ±108 nm/cm3.3 的第三级扭曲测量精度.
结论:
- 提出的尼奎斯特采样方法提供了高精度的扭曲评估.
- 这种技术适用于传统的工业成像镜头.
- 该方法提供可靠和准确的镜头扭曲数据.
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