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Updated: Oct 15, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Published on: May 28, 2016

亚衍射极限缺陷检测的结构光照明显微相位导数法

Jiating An, Lingbao Kong, Min Xu

    Optics letters
    |October 13, 2026
    PubMed

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    Phase Contrast and Differential Interference Contrast Microscopy01:26

    Phase Contrast and Differential Interference Contrast Microscopy

    Phase-Contrast Microscopes
    In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
    Super-resolution Fluorescence Microscopy01:37

    Super-resolution Fluorescence Microscopy

    Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.