Scanning-tunneling-microscopy signatures and chemical identifications of the (110) surface of Si-doped GaAs

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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Wang, Arias, Joannopoulos

    Physical Review. B, Condensed Matter
    |April 15, 1993
    PubMed
    Abstract

    No abstract available in PubMed .

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