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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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Published on: September 28, 2016

Strain Relief during Growth: CaF2 on Si(111)

Tromp, LeGoues, Reuter

    Physical Review Letters
    |April 3, 1995
    PubMed
    Summary

    No abstract available in PubMed .

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