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Updated: Aug 2, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

New mechanism for dislocation blocking in strained layer epitaxial growth

Stach1, Schwarz, Hull

  • 1National Center for Electron Microscopy, LBNL, Berkeley, California 94720, USA.

Physical Review Letters
|October 4, 2000
PubMed

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