The modification of the electron microscope for special crystallographic applications
Related Experiment Video
Updated: Jul 21, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Abstract:
The conversion of the transmission electron microscope to a convergent-beam camera and shadow microscope with facilities for experiments using two specimens located in different planes is discussed, with particular reference to older models such as the Elmiskop 1. The conversion requires the removal of the intermediate lens in some microscopes and thus prevents them from operating in their original capacity. The Elmiskop 1 has a wide intermediate lens pole-piece which does not unduly restrict the diffraction angle. The smallest crystal spacing contributing to the convergent-beam diffraction pattern is 0.05 nm.
Related Concept Videos
Overview of Electron Microscopy
Transmission Electron Microscopy
Cryo-electron Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Microscopy Techniques
Determination of Crystal Structures

