A new 200 kV Omega-filter electron microscope
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Updated: Oct 22, 2026

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Serial Block-Face Scanning Electron Microscopy (SBEM) for the Study of Dendritic Spines
Published on: October 2, 2021
1Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan.
Journal of Microscopy
|May 13, 1999
Abstract:
A new 200 kV Omega-filter electron microscope was developed under a project supported by a Grant-in-Aid for Specially Promoted Research of the Ministry of Education, Science, Sports and Culture of Japan. The performance of the microscope is described.
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