Use of quantitative convergent-beam electron diffraction in materials science

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Updated: Oct 19, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

R Holmestad1, C R Birkeland, K Marthinsen

  • 1Department of Physics, Norwegian University of Science and Technology (NTNU), N-7491 Trondheim, Norway. randih@phys.ntnu.no

Microscopy Research and Technique
|July 29, 1999
PubMed

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