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X-ray Crystallography

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Related Experiment Video

Updated: Jan 2, 2026

$Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene$

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

Nanocrystal segmentation in scanning precession electron diffraction data.

T Bergh¹, D N Johnstone², P Crout²

¹Department of Physics, Norwegian University of Science and Technology (NTNU), Trondheim, Norway.

Journal of Microscopy

|December 4, 2019

Summary

This summary is machine-generated.

This study presents two methods for nanocrystal segmentation in scanning precession electron diffraction (SPED) data, enabling precise analysis of overlapping nanoparticles. Open-source workflows are provided for reproducible research in materials science.

Keywords:

Nanoparticles non-negative matrix factorization open-source scanning precession electron diffraction virtual dark-field imaging watershed segmentation

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Last Updated: Jan 2, 2026

$Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene$

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Published on: August 22, 2017

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Area of Science:

Materials Science
Nanotechnology
Electron Microscopy

Background:

Scanning precession electron diffraction (SPED) is a powerful nanoscale materials characterization technique.
SPED data often contain diffraction patterns from multiple overlapping crystals, complicating analysis.
Nanocrystal segmentation is crucial for isolating individual crystal signals and reducing data dimensionality.

Purpose of the Study:

To develop and compare two distinct methods for nanocrystal segmentation in SPED data.
To address challenges in segmenting overlapping nanoparticles and crystals with similar diffraction conditions.
To provide open-source analysis workflows for the scientific community.

Main Methods:

Virtual dark-field imaging approach for nanocrystal segmentation.
Non-negative matrix factorization (NMF) for unsupervised nanocrystal segmentation.
Integration of image segmentation routines to enhance results.

Main Results:

Both virtual dark-field imaging and NMF effectively segment nanocrystals in SPED data without prior structural knowledge.
Challenges were identified, particularly with crystals exhibiting identical diffraction conditions.
Segmentation artifacts were observed and require careful consideration during analysis.

Conclusions:

Two viable methods for nanocrystal segmentation in SPED data are demonstrated.
The presented techniques facilitate the analysis of complex nanocrystalline materials.
Open-source availability of code and data promotes further research and development.