Signal components in the environmental scanning electron microscope.

Fletcher1, Thiel, Donald

  • 1Polymers and Colloids Group, Cavendish Laboratory, Department of Physics, Madingley Road, University of Cambridge, Cambridge CB3 0HE, U.K.

Journal of Microscopy
|December 14, 1999
PubMed
Summary

Environmental scanning electron microscopy (ESEM) signals contain both useful and unwanted components. This study separates secondary and backscattered electron signals, revealing how gas pressure and chemistry affect ESEM imaging quality.

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