Related Experiment Video
Updated: Aug 10, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
Orientation relationships of martensite variants determined by electron backscatter diffraction
Abstract:
Orientation relationships between the parent phase and 2H type martensite, and between different variants in a plate group of martensite in the CuAlNi shape memory alloy were determined by electron backscatter diffraction. The result reveals clearly that the basal planes of different correspondence variants of the 2H martensite originate from different 110P planes of the parent phase, and the [010]2H axis of each correspondence variant originates from one of the <001>P axes of the parent phase. Our result reveals also the typical relationships of four habit-variants A, B, C and D in a martensite plate group, and that the habit-variants A and C (and equivalenty B and D) are twin-related by an 1212H mirror plane, and the habit-variants A and D (and B and C) are twin-related by an 1012H mirror plane. Usually, variants A and C (and B and D) form spear morphology and variants A and D (and B and C) form fork morphology.
Related Concept Videos
X-ray Crystallography
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Relation between Poisson's ratio, Modulus of Elasticity and Modulus of Rigidity
Determination of Crystal Structures

