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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on: September 28, 2016

Nanoshocks in molecular materials

D D Dlott1

  • 1School of Chemical Sciences, University of Illinois at Urbana-Champaign, Box 01-6 CLSL, 600 South Goodwin Avenue, Urbana, Illinois 61801, USA.

Accounts of Chemical Research
|March 29, 2000
PubMed

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