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Microwave imaging using the finite-element method and a sensitivity analysis approach.

I T Rekanos, S M Panas, T D Tsiboukis

    IEEE Transactions on Medical Imaging
    |February 8, 2000
    PubMed
    Summary
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    This study presents a novel method for reconstructing scatterer properties using scattered field data. The finite-element method (FEM) and Tikhonov regularization are employed to solve inverse scattering problems effectively.

    Area of Science:

    • Electromagnetics and computational physics
    • Inverse problems and numerical methods

    Background:

    • Reconstructing constitutive parameters of penetrable scatterers from scattered field data is crucial for various applications.
    • Existing methods often struggle with ill-posed inverse problems and computational efficiency.

    Discussion:

    • A differential formulation of the forward scattering problem is solved using the finite-element method (FEM).
    • A cost function, incorporating measurement error and Tikhonov regularization, is minimized using a nonlinear conjugate gradient algorithm.
    • Sensitivity analysis via FEM and adjoint state vector methodology enhance computational efficiency and accuracy.

    Key Insights:

    • The proposed method effectively reconstructs scatterer parameters from scattered field measurements.
    • The integration of FEM and Tikhonov regularization addresses the ill-posed nature of inverse scattering problems.

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  • The technique demonstrates robustness against noise and varying regularization levels.

    • Outlook:

    • The method holds promise for applications in microwave medical imaging, such as detecting proliferated bone marrow.
    • Further research could explore extensions to more complex scatterer geometries and different measurement modalities.