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Cell-microcarrier adhesion to gas-liquid interfaces and foam
P Bauer1, L Hancock, J Rathman
1Department of Chemical Engineering, The Ohio State University, 140 W. 19th Avenue, Columbus, Ohio 43210, USA.
Biotechnology Progress
|February 9, 2000
Summary
Microcarriers readily attach to gas bubbles, but cells on microcarriers are protected from bubble rupture damage. Cell damage during sparging may occur as cells detach from microcarriers when bubbles rise.
Area of Science:
- Biotechnology
- Cell Culture Engineering
- Bioprocess Engineering
Background:
- Microcarrier cultures are widely used for cell expansion in bioprocessing.
- Gas sparging is common in bioreactors but can cause cell damage.
- Understanding microcarrier-bubble interactions is crucial for optimizing cell culture conditions.
Purpose of the Study:
- To investigate the interaction between microcarriers (with and without cells) and gas bubbles.
- To evaluate protective additives for preventing microcarrier adhesion to bubbles and foam entrapment.
- To assess the impact of bubble rupture on cells attached to microcarriers.
Main Methods:
- Qualitative microscopic observation of microcarrier-bubble interactions.
- Quantitative measurement of microcarrier entrapment in foam layers.
- Quantitative assessment of bubble rupture effects on attached cells.
- Evaluation of ten "protective additives" for surface tension modification and adhesion prevention.
Main Results:
- Microcarriers, with or without cells, readily adhere to gas-medium interfaces.
- Cells attached to microcarriers are not damaged by bubble ruptures, unlike suspended cells.
- One surfactant reduced foam entrapment but proved toxic to cells.
- No correlation was found between surface tension changes and prevention of microcarrier adhesion to interfaces.
Conclusions:
- Cell damage in microcarrier cultures during sparging is likely due to cells detaching from microcarriers as bubbles rise.
- Hydrodynamic drag forces may dislodge bubble-attached cells from microcarriers.
- Further strategies are needed to mitigate cell damage during gas sparging in microcarrier systems.