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Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM

Cremona1, Mauricio, Scavarda Do Carmo LC

  • 1Departamento de Física, Pontifícia Universidade Católica do Rio de Janeiro (PUC-Rio), Rua Marques São Vicente 225, 22453-900, Rio de Janeiro, Brazil; Centro Brasileiro de Pesquisas Físicas, Rua Dr Xavier Sigaud 150, 22290-180, Rio de Janeiro, Brazil; Departamento de Informática, Universidade Iguaçu/FaCET, Av. Abilio Augusto Tavora 2134, Nova Iguaçu, Rio de Janeiro, Brazil.

Journal of Microscopy
|February 26, 2000
PubMed

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