Related Experiment Video
Updated: Aug 5, 2026

Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries
Published on: April 22, 2013
The spatial resolution of 3D atom probe in the investigation of single-phase materials
1Sonde Atomique et Microstrustures, UMR CNRS 6634-UFR Sciences, Mont Saint Aignan, France. francois.vurpillot@univ-rouen.fr
Abstract:
The resolution of three-dimensional atom probe (3DAP) is known to be mainly controlled by the aberrations of the ion trajectories near the surface of the specimen. A model has been developed to compute the ion trajectories in 3D near a sharp hemispherical electrode defined at the atomic scale. Simulations were applied on one-phase binary alloys. The influence of the evaporation fields of chemical species is studied. Simulated desorption images are consistent with experiments in both ordered alloys and random solid solution. An extra loss in the lateral resolution is observed in disordered alloys as compared to pure metals. The predicted order of evaporation provided by this model is in excellent agreement with experiments. The stacking sequence of atomic planes reconstructed from simulated data is shown to be disturbed in a similar way as observed in real experiments with 3DAP.
Related Concept Videos
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Microscopy Techniques

