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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

Advantages of stereo imaging of metallic surfaces with low voltage backscattered electrons in a field emission

Richards1, Wieland, Textor

  • 1Interface Biology, AO ASIF Research Institute, ClavadelerStrasse, CH 7270, Davos, Switzerland Laboratory for Surface Science and Technology, Department of Materials, Swiss Federal Institute of Technology Zurich, CH-8092 Zurich, Switzerla.

Journal of Microscopy
|August 18, 2000
PubMed

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