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Photon-assisted tunneling in electron pumps

Covington1, Keller, Kautz

  • 1National Institute of Standards and Technology, Boulder, Colorado 80303, USA.

Physical Review Letters
|September 16, 2000
PubMed
Summary

We measured photon-assisted tunneling in electron pumps up to 60 GHz. This phenomenon, driven by 1/f noise, is a key error source in electron pumps without external microwaves.

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Area of Science:

  • Quantum electronics
  • Mesoscopic physics

Background:

  • Electron pumps are crucial for precise charge transfer.
  • Understanding error mechanisms is vital for quantum device accuracy.
  • Photon-assisted tunneling can influence charge transport.

Purpose of the Study:

  • To experimentally investigate photon-assisted tunneling in multi-junction electron pumps.
  • To quantify the impact of microwave frequencies on tunneling.
  • To validate theoretical models of electron pump leakage.

Main Methods:

  • Utilizing 4- and 6-junction electron pumps.
  • Employing noise thermometry to determine microwave voltage.
  • Conducting experiments at photon frequencies up to 60 GHz.

Main Results:

  • Photon-assisted tunneling was successfully measured in electron pumps.
  • A modified leakage theory accurately described experimental data.
  • The microwave voltage at the pumps was precisely determined.

Conclusions:

  • Photon-assisted tunneling is well-described by modified leakage theory.
  • 1/f noise-driven photon-assisted tunneling is a significant error source in electron pumps.
  • This finding is particularly relevant in the absence of external microwaves.

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