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Updated: Oct 11, 2026

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on: July 17, 2020
Resolution of the scaling exponent puzzle for weakly compensated crystalline silicon and germanium metal-insulator
1Department of Physics and Applied Physics, University of Massachusetts Lowell, Lowell, Massachusetts 01854, USA.
Abstract:
Using a classical theory for ionized impurity scattering, it is demonstrated that in the degenerate regime the conductivity scales as sqrt[epsilon(F)] where the Fermi energy is measured with respect to the mobility edge. The approach, a special case of alloy theory, explains the conductivity scaling exponent s = 1 / 2 observed for weakly compensated, doped crystalline Si and Ge. The results explain the breadth of scaling range and suggest how to obtain a consistent picture of the scaling of the mobility, diffusion coefficient, and Hall coefficient.
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